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  • B. Kim, "Efficient Signature-Driven Self-Test for Differential Mixed-Signal Circuits," Journal of Semiconductor Technology and Science, vol.16, no.5, pp.713-718, Oct. 2016

  • B.Kim, et al., "Low-power Incremental Delta-Sigma ADC for CMOS Image Sensors," IEEE Transactions on Circuits and Systems II, vol.63, no.4, pp.371-375, Apr. 2016

  • B.Kim, et al., "Fast Digital Image Encryption Based On Compressive Sensing Using Structurally Random Matrices and Arnold Transform Technique," International Journal for Light and Electron Optics, vol.127, no.4, pp.2282-2286, Feb. 2016

  • B. Kim, "Dithering Loopback-based Prediction Technique for Mixed-Signal Embedded System Speciffications," IEEE Transactions on Circuits and Systems II, vol.63, no.2, pp.121-125, Feb. 2016

  • B.Kim, et al., "Sparse-based multispectral image encryption via ptychography," Optics Communications, vol.356, pp.296-305, Dec. 2015 

  • B.Kim, et al., "A 10-bit 200-Msample/s Zero-Crossing Based Pipeline ADC in 0.13-um CMOS technology," IEEE Transactions on Very Large Scale Integration Systems, vol.23, no.11, pp.2671-2675, Nov. 2015

  • B.Kim, et al., "Neuromorphic Hardware System for Visual Pattern Recognition with Memristor Array and CMOS Neuron," IEEE Transactions on Industrial Electronics, vol.62, no.4, pp.2410-2419, Apr. 2015

  • B.Kim, et al., "Compressive Sensing based Robust Multispectral Double-Image Encryption," Applied Optics, vol.54, no.7, pp.1782-1783, Feb. 2015

  • B.Kim, et al., "Designing Nonlinearity Characterization for Mixed-Signal Circuits in System-On-Chip," Springer Analog Integrated Circuits and Signal Processing, vol.82, no.1, pp.341-348, Jan. 2015

  • B.Kim, et al., "Implementation of a Portable Device for Real-time ECG Signal Analysis," BioMedical Engineering Online, Dec. 2014

  • B.Kim, et al., "Bitstream-Driven Built-in Characterization for Analog and Mixed-Signal Embedded Circuits," IEEE Transactions on Circuits and Systems II, vol.61, no.10, pp.743-747, Oct. 2014

  • B.Kim, et al., "Encryption and Volumetric 3D Object Reconstruction using Multispectral Computational Integral Imaging," Applied Optics, vol.53, no.27, pp.G25-G32, Sep. 2014

  • B.Kim, et al., "Digital Foreground Calibration of Capacitor Mismatch for SAR ADCs," IET Electronics Letters, vol.50, no.20, pp.1423-1425, Sep. 2014

  • B.Kim, et al., "Dynamic Performance Characterization of Embedded Single-Ended Mixed-Signal Circuits," IEEE Transactions on Circuits and Systems II, vol.61, no.5, pp.329-333, May. 2014

  • B.Kim, et al., "Capacitor-Coupled Built-Off Self-Test in Analog and Mixed-Signal Embedded Systems," IEEE Transactions on Circuits and Systems II, vol.60, no.5, pp.257-261, May. 2013

  • B.Kim, et al., "Imbalance-Based Self-Test for High-Speed Mixed-Signal Embedded Systems," IEEE Transactions on Circuits and Systems II, vol.59, no.11, pp.785-789, Nov. 2012

  • B.Kim, et al., "Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits," IEEE Transactions on Circuits and Systems I, vol.58, no.8, pp.1773-1784, Aug. 2011

  • B.Kim, et al., "Transformer-Coupled Loopback Test for Differential Mixed-Signal Dynamic Specifications," IEEE Transactions on Instrumentation and Measurement, vol.60, no.6, pp.2014-2024, Jun. 2011

  • B.Kim, et al., "Predicting mixed-signal dynamic performance using optimised signature-based alternate test," IET Computers & Digital Techniques, vol.1, no.3, pp.159-169, May 2007

  • B.Kim, et al., "Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits," IEEE VLSI Testing Symposium, pp.293-298, May. 2008. (Speaker)

  • B.Kim, et al., "Transformer-Coupled Loopback Test for Differential Mixed-Signal Specifications," IEEE VLSI Testing Symposium, pp.291-296, May. 2007. (Speaker)

  • B.Kim, et al., "Optimized Signature-Based Statistical Alternate Test for Mixed-Signal Performance Parameters," IEEE European Test Symposium, pp.199-204, May. 2006. (Speaker)- Invited to the journal IET-CDT

  • B.Kim, et al., "Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits," IEEE VLSI Testing Symposium, pp.414-419, April 2006.-The Best Paper Award

  • B.Kim, et al., "Predicting Mixed-Signal Specifications with Improved Accuracy Using Optimized Signatures," IEEE International Mixed-Signals TestingWorkshop, pp.113-122, May. 2005. (Speaker)

  • B.Kim, et al., "Analysis of Time Delay for Stability of Discrete Control System," The Fall Conference in The Korean Institute of Electrical Engineers, pp.112-117, Nov. 1999. (Speaker)

  • B.Kim, et al., "Bound of Time Delay for Stability of Discrete Control System," The Korea Automatic Control Conference, pp.201-206, Oct. 1999. (Speaker)

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